Data for reference edwards-apl-69-2065

Real-time assessment of overlayer removal on GaN, AlN, and AlGaN surfaces using spectroscopic ellipsometry

NV Edwards, MD Bremser, TW Weeks, RS Kern, RF Davis

Applied Physics Letters 69(14), 2065 (1996).

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This item is cited by the following items in the database:

  1. Spectroscopic Ellipsometry on GaN: Comparison Between Hetero-epitaxial Layers and Bulk Crystals

Contributed by A.E. Nikolaev from 194.85.224.35 on Sunday, October 13, 1996 1:24:48 PM

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