wetzel-apl-68-2547

Data for reference wetzel-apl-68-2547

Infrared reflection of GaN and AlGaN thin film heterostructures with AlN buffer layers

C. Wetzel, E. E. Haller , H. Amano, I. Akasaki

Applied Physics Letters 68(18), 2547 (1996).

The authors have measured and calculated infrared reflection spectra obtained within the phonon region of GaN, AlGaN and AlN heterostructures grown on sapphire and Si substrates.

This item is cited by the following items in the database:

Optical phonons and free-carrier effects in MOVPE grown Al_xGa_1-xN measured by Infrared Ellipsometry

Contributed by Xiuling Li from cowboy.ccsm.uiuc.edu. on Monday, June 10, 1996 6:02:50 PM
Modified by Andrei Nikolaev from shuttle.ioffe.rssi.ru

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