Center for Microelectronic and Optical Materials Research and Department of Electrical Engineering, University of Nebraska-Lincoln

Data for organization engrs.unl.edu

Center for Microelectronic and Optical Materials Research and Department of Electrical Engineering, University of Nebraska-Lincoln

Address

Center for Microelectronic and Optical Materials Research and Department for Electrical Engineering 
209N Walter Scott Engineering Center
P.O. Box 0511
Lincoln NE 68502, U.S.A.

Articles in MRS Internet Journal of Nitride Semiconductor Research by Authors from this Organization

Optical phonons and free-carrier effects in MOVPE grown Al_xGa_1-xN measured by Infrared Ellipsometry (1999)
Free-carrier effects and optical phonons in GaNAs/GaAs superlattice heterostructures measured by infrared spectroscopic ellipsometry (2000)

To submit corrections to the information on this page, please send mail to the database editor at db2 at nsr.mij.mrs.org or contact M. Schubert .

last updated Friday, January 11, 2002 10:57:53 AM.