Prof James Copper of Purdue University supplied the following trip report: Trip Report 2nd International Workshop on Hard Electronics Tsukuba, Japan Feb 3-4, 1998 This workshop was sponsored by the New Energy & Industrial Technology Development Organization (NEDO) and the R&D Association for Future Electron Devices (FED) and held at the Electrotechnical Laboratory (ETL) in Tsukuba. Prof. H. Matsunami of Kyoto University chaired the Organizing Committee. About 250 researchers from Japanese companies, universities, and government laboratories attended. "Hard Electronics" encompasses SiC, GaN, diamond, and vacuum microelectronics. Although "Hard Electronics" could be taken in two ways, the Japanese intention is to denote applications in hostile, rugged environments such as high power, high temperature, and high radiation. The only outside speakers were myself and Chuck Weitzel of Motorola PCRL. All other talks were in Japanese, but the Digest was in English. To indicate the broad participation from within Japan, I list the organizations presenting papers or posters and their topics below: Universities Tokyo Inst. of Tech. (SiC, metal oxides) Nagoya Inst. of Tech. (SiC, III-N) U. of Tsukuba (SiC, diamond, metal oxides) Tohoku U. (Silicon, diamond, metal oxides) Hosei U. (SiC) U. of Erlangen-Nuremberg (SiC) Nihon U. (SiC) Kyoto U. (SiC) Tokai U. (diamond) Osaka U. (diamond, III-N, metal oxides) Waseda U. (diamond) Yokohama Nat'l. U. (III-N) Kochi U. of Tech. (diamond) Government Laboratories Electrotechnical Lab. (SiC, diamond, III-N) Japan Atomic Energy Res. Inst. (SiC) Ion Engineering Res. Inst. (SiC) Nat'l. Inst. for Res. in Inorganic Mat'ls. (diamond) Industrial Laboratories Fuji Electric Co. (SiC) Toyota Central R&D Labs. (SiC, III-N) ULVAC Corp. (SiC) Sanyo Electric Co. (SiC) Mitsubishi Electric Corp. (SiC) Hitachi, Ltd. (SIC) Kansai Electric Power Co. (SiC) Denso Corp. (SiC) Matsushita Electronics Corp. (SiC, Josephson Junc.) Sumitomo Chemical Co., Ltd. (III-N) Furukawa Electric Co., Ltd. (III-N) Sony Corp. (III-N) In addition to the workshop, I visited the Electrotechnical Labs. as a guest of Dr. Kazuo Arai, Leader of Hard Electronics Research, ETL. The SiC group at ETL consists of about 12 researchers working in a variety of areas including 3C growth, Schottky and ohmic contacts, and sublimation boule growth. ***** Japanese National Program on Hard Electronics ***** MITI is sponsoring a five-year National Program on Hard Electronics, to begin sometime in 1998. The funding level is estimated at 5-7 billion yen, or $40-55M, with the program restricted to industrial and government laboratories. The concentration areas are (i) high power, high speed, low loss power switching devices, (ii) devices for severe conditions such as space, nuclear energy and well logging, and (iii) devices for information and communication electronics. The primary technologies to be pursued are SiC, III-N, diamond, and vacuum microelectronics. The working goals are to reduce the electrical losses of power electronics by a factor of 100, to increase the frequency of communication devices by a factor of 100, to increase radiation tolerance by a factor of 100, and to achieve working temperatures in the 500 - 800 C range. In the SiC area, the goals are to produce larger substrates (3-4 inch dia.), to improve substrate material quality, and to conduct a parallel research effort on device fabrication issues. ________________________________________________________ Dr. John C. Zolper Electronics Division, Code-312 Office of Naval Research 800 North Quincy Street Arlington VA 22217-5660 email: zolperj@onr.navy.mil http://www.onr.navy.mil/