Book Review:GaN and Related Materials, Edited by Stephen J. Pearton

(Gordon and Breach Science Publishers, Amsterdam,1997), ISBN 90-5699-517-0

Volume 2 of Optoelectronic Properties of Semiconductors and Superlattices, M. O. Manesreh, series editor, ISSN 1023-6619

Reviewed for MIJ-NSR by Eric S. Hellman

When I was first asked to have this book reviewed for MIJ-NSR, I thought I'd send it to someone prominent in the field to review it. But who? When I received the review copy I was faced with a problem: just about all the people I had thought of to write a review were already chapter authors. And the coverage was broad, it looked like a nice book, so I figured I'd do the review myself.

The main problem with this sort of book is inherent in the format. Instead of a complete, coherent overview of a field, this book is a collection of articles with different viewpoints, sometimes overlapping coverage, some important omissions, and a significant time lag. And as the authors of the articles are undoubtably busy doing research and giving invited papers at meetings around the world, sometimes the articles in this sort of book can have a stapled-together sort of quality. For the most part, this book avoids that problem. A few of the articles are a bit focussed on the authors' own work, but that is not necessarily a bad thing. And occasionally the articles contradict one another. For example, in one section, the lattice mismatch between GaN and sapphire is given with the wrong sign as 13.8%; in another section, it is given with the wrong magnitude and sign as 16%. (by wrong I mean mean "different from the sensibly motivated definition given in Matthews' classic Epitaxial Growth").

GaN is a rapidly moving field, so many of the articles will age rapidly. The articles which will remain useful the longest are those that cover more mature fields. Authors for this type of volume are confronted with a difficult choice between writing an exciting but perishible article, and writing a boring but useful article. In this volume, different articles take different approaches.

So, to the articles themselves:

The remainder of the book is much more device and processing oriented. Many people working on aspects of GaN may want to skip these sections as they don't really give recipes for how to do things. On the other hand, people doing processing of GaN will want to study them closely. I expect that these areas will change more than most because the quality of epitaxial material will improve and might change everything.

Overall, this book is a useful reference for many scientists, particularly for those doing optical characterization or device processing research. I recommend it also as a valuable addition to libraries, as several of the articles are likely to be important reference works in their fields.

Eric Hellman


MRS Internet Journal of Nitride Semiconductor Research

last updated November 17, 1997 2:52:25 PM.
© 1997 The Materials Research Society
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