Keyword Index

A | B | C | D | G | H | I | L | M | N | O | P | R | S | T | V | X

A

Keywords: GaN

adatom

AlGaN


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B

buffer layer

bulk crystal

Bulk crystals


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C

c-BN

C-V

critical

Crystal morphology

cubic boron nitride

cubic phase


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D

deep centers

defects

defects filtering

degradation

diffractometry

diffusion

dislocations

doping.


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E

electron-irradiation

ELOG

epitaxy

EPVOM

ESR


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G

gallium nitride

gallium nitrides

GaN

GaN pyramids

GaN, MOCVD, capillary epitaxy

GaN, Molecular Beam Epitaxy

group III-nitrides

growth


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H

heterostructures

HVPE

hydride vapor phase epitaxy


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I

III-V

imaging

impurities

InGaAlN

InGaN


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L

lasing

lateral

lateral overgrowth

LED

LEDs

light-emitting diodes

localized epitaxy

losses

luminescence

luminescence.


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M

Magnesium

magnetooptics

MBE

measurements

Mg doping

microdistortion dislocations

miscibility gap

MOCVD

modeling

molecular beam epitaxy

morphology

MOVPE

multiwafer


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N

nitride lasers

nitrides and luminescence.


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O

optical

optical properties

overgrowth


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P

Peierls force

phase separation

photodetectors.

photoluminescence

piezoelectric effects

pinholes

planetary


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Q

quantum wells


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R

Raman scattering

recoiled ions.

reconstructions

resonance


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S

sapphire substrate

Schottky

Schottky diodes

selective area

shallow donors

Silicium

solid solutions

stacking faults

stimulated emission

strain effect

strain relaxation

sublimation

substrates

surface damage

surface morphology

surface reconstruction

surface structures

surfactants


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T

ternary

thickness

threshold analysis

time of flight mass spectroscopy of


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V

VCSELs


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X

X-ray diffractometry

X-ray measurements

The keywords used in this indexing have been supplied by the authors.  
 
 
MRS Internet Journal of Nitride Semiconductor Research