Figure 18

FWHM of omega (0002) for HT-GaN films deposited on GaN (open circles) and AlN (closed circles) buffer layers with the same thickness, when the buffer layers were annealed for the times shown in the figure. The conditions for obtaining better quality HT-GaN material are wider with GaN buffer layers [127]].


top        text     Figure 17     Figure 19        endnotes

last updated Tuesday, October 18, 2005 9:58:04 AM.

© 2004-2005 The Materials Research Society MRS Internet Journal of Nitride Semiconductor Research