Figures

Figure 1

X-ray -2 scan for a GaN:Mg epilayer on a-plane sapphire.

Figure 2

X-ray -2 scan for a GaN:Mg epilayer on a-plane sapphire. The solid curve indicates a Gaussian fit to the experimental data.

Figure 3

Atomic force microscopy image for a ~1 micron thick a-plane GaN:Mg epilayer on r-plane sapphire.

Figure 4

Photoluminescence spectrum (14 K) for an a-plane GaN:Mg epilayer.

© 2003 The Materials Research Society