X-ray
-2
scan for a GaN:Mg epilayer on a-plane sapphire.
X-ray
-2
scan for a GaN:Mg epilayer on a-plane sapphire. The solid curve indicates a Gaussian fit to the experimental data.
Atomic force microscopy image for a ~1 micron thick a-plane GaN:Mg epilayer on r-plane sapphire.
Photoluminescence spectrum (14 K) for an a-plane GaN:Mg epilayer.