SEM and AFM images of as-grown and LT-buffer GaN for an annealing temperature of initial buffer at 550° (RMS: 2.4 nm).
SEM and AFM images of as-grown and LT-buffer GaN for an annealing temperature of 950° (RMS: 7.1 nm).
SEM and AFM images of as-grown and LT-buffer GaN for an annealing temperature of 1020° (RMS: 22 nm).
SEM and AFM images of as-grown and LT-buffer GaN for an annealing temperature of 1050° (RMS: 24 nm)
HRXRD diffraction data for as-grown and LT-buffer GaN at different annealing temperatures: initial buffer at 550°, 950°, 1020°, and 1050°
PL spectra at 10 K for as-grown and LT-buffer GaN at different annealing temperatures: initial buffer at 550°, 950°, 1020°, and 1050°
Sheet resistance and electron mobility of undoped GaN films grown at various temperatures: 950°, 980°, 1000°, 1020°, and 1050°
SEM photographs of undoped GaN films grown at 950°.
SEM photographs of undoped GaN films grown at 980°.
SEM photographs of undoped GaN films grown at 1000°.
SEM photographs of undoped GaN films grown at 1020°.
SEM photographs of undoped GaN films grown at 1050°.
Proposed two-step growth procedure. Inset shows SEM photographs of semi-insulating GaN grown based on two-step growth.
SEM and AFM images of a sample grown at 1020 ° for 3 min based on typical one-step growth..
SEM and AFM images of a sample grown at 950 ° for 1 min and at increasing temperature up to 1020 ° for 2 min based on proposed two-step growth.
Cross-sectional TEM images of typical one-step sample under 0002 two-beam.
Cross-sectional TEM images of special two-step sample under 0002 two-beam.
PL spectra for samples grown based on one-step growth and two-step growth for 3 min. Inset shows PL spectra for both samples grown for 40 min.
Frequency response characteristics of fabricated GaN SAW filters with wavelength of 40 µm for undoped GaN film grown at 1020°.
Frequency response characteristics of fabricated GaN SAW filters with wavelength of 40 µm for semi-insulating GaN film grown based on two-step growth.