Monochromatic CL images from the cleaved edge of an AlGaN epitaxial film. Recorded at (a) 3.69 eV and at (b) 3.75 eV. The sample was mounted with an approximate tilt of 45 degrees. The dark left part of the image is the SiC and the brighter region in the center of the image correspond to the side of the epitaxial film. The right part corresponds to the top of the epitaxial film.
© 2002 The Materials Research Society
