Dependence of Aging on Inhomogeneities in InGaN/AlGaN/GaN Light-Emitting Diodes


Vladimir E. Kudryashov, Sergey S. Mamakin, Andrey N. Turkin, Alexander E. Yunovich
M.V. Lomonosov MSU

Alexei N. Kovalev, Fedor I. Manyakhin
Moscow Institute of Steel and Alloys

This article was presented as part of Symposium W, "Gallium Nitride and Related Alloys" at the 1999 Fall Meeting of the Materials Research Society held in Boston, Massachusetts, November 28-December 3

Abstract

Changes of properties of green LEDs based on InxGa1-xN/AlyGa1-y/GaN heterostructures were studied during 150--200 hours at currents J = 30--80 mA. The radiation intensity at low currents (0.1--1 mA) is quite sensitive to such an aging, it falls down 1--100 times. Quantum efficiency and spectral parameters at normal currents (J ≊ 10 mA) change non-monotonically during aging, some degradation is observed after 168 hours. The degradation is observed also after a short (< 1 min) period of reverse current. These phenomena are discussed in terms of under threshold defect"s formation and their migration in the space charge region of p-n-heterojunction. Potential fluctuations in the space charge region are quite sensitive to this process.

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Cite this article as: MRS Internet J. Nitride Semicond. Res. 5S1, W11.25 (2000).


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MRS Internet Journal of Nitride Semiconductor Research
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