[1] M Kondow, K Uomi, T Kitatani, S Watahiki, Y Yazawa, J. Cryst. Growth 164, 175-179 (1996). [text citation]
[2] Su-Huai Wei, Alex Zunger , Phys. Rev. Lett. 76, 664-667 (1996). [text citation]
[3] Jorg Neugebauer, Chris G. Van de Walle , Phys. Rev. B 51, 10568-10571 (1995). [text citation]
[4] A Ougazzaden, YL Bellego, EVK Rao, M Juhel, L Leprince, G Patriarche, Appl. Phys. Lett. 70, 2861-2863 (1997). [text citation]
[5] E. V. K. Rao, A. Ougazzaden, Y. Le Bellego, M. Juhel, Appl. Phys. Lett. 72, 1409 (1998). [text citation]
[6] WG Bi, CW Tu, Appl. Phys. Lett. 70, 1608-1610 (1997). [text citation]
[7] S. Francoeur, G. Sivaraman, Y. Qiu, S. Nikishin, H. Temkin, Appl. Phys. Lett. 72, 1857 (1998). [text citation]
[8] K. Uesugi, I. Suemune, Jpn. J. Appl. Phys. 36, L1572 (1997). [text citation]
[9] K. Onabe, D. Aoki, J. Wu, H. Yaguchi, Y. Shiraki, Phys. Stat. Sol. A 176, 231 (1999). [text citation]
[10] I. A. Buyanova, W. M. Chen, G. Pozina, J. P. Bergman, B. Monemar, H. P. Xin, C. W. Tu, Appl. Phys. Lett. 75, 501 (1999). [text citation]
[11] A. M. Mintairov, P. A. Blagnov, V. G. Melehin, N. N. Faleev, J. L. Merz, Y. Qiu, S. A. Nikishin, H. Temkin, Phys. Rev. B 56, 15836 (1997). [text citation]
[12] T. Prokofyeva, T. Sauncy, M. Seon, M. Holtz, Y. Qiu, S. Nikishin, H. Temkin, Appl. Phys. Lett. 73, 1409 (1998). [text citation]
[13]A. Roeseler, Infrared Spectroscopic Ellipsometry, (Akademie-Verlag, Berlin 1990) [text citation]
[14] D. W. Berreman, Phys. Rev. 130, 2193 (1963). [text citation]
[15] J. Humlicek, Phys. Stat. Sol. B 215, 155 (1999). [text citation]
[16] St. Zollner, J. P. Carrejo, T. E. Tiwald, J. A. Woollam, Phys. Stat. Sol. B 208, R3 (1998). [text citation]
[17]M. Schubert, A. Kasic, T. E. Tiwald, J. A. Woollam, V. Härle, F. Scholz, "Phonons and free carriers in a strained hexagonal GaN-AlN superlattice measured by Infrared Ellipsometry and Raman spectroscopy", Mater. Res. Soc. Symp. Proc. 595, W11.39 (2000) [text citation]
[18] M. Schubert, A. Kasic, T.E. Tiwald, J. Off, B. Kuhn, Ferdinand Scholz, MRS Internet J. Nitride Semicond. Res. 4, 11 (1999). [text citation]
[19] M. Schubert, J. A. Woollam, A. Kasic, B. Rheinländer, J. Off, B. Kuhn, F. Scholz, Phys. Stat. Sol. B 216, 655 (1999). [text citation]
[20]J. Sik, M. Schubert, G. Leibiger, V. Gottschalch, G. Kirpal, J. Humlícek, "Near-band-gap optical constants spectra and band-gap energies of GaNAs/GaAs superlattice heterostructures measured by spectroscopic ellipsometry", Appl. Phys. Lett., in press (2000) [text citation]
[21] M. Schubert, T. E. Tiwald, C. M. Herzinger, Phys. Rev. B 61, 8187 (2000). [text citation]
[22]A. Kasic, M. Schubert, T.E. Tiwald, J.A. Woollam, S. Einfeldt and D. Hommel, "Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by Infrared Ellipsometry", unpublished. [text citation]
[23] A. A. Kukharskii, Sol. St. Comm. 13, 1761 (1973). [text citation]
[24]V. M. Agranovich, D. L. Mills (editors) Surface Polaritons (North-Holland, Amsterdam, 1982), p.10 [text citation]
[25] M. Schubert, T. Hofmann, T. E. Tiwald, J. Sik, unpublished (2000) . [text citation]
[26]S. S. Mitra, "Optical Properties of Nonmetallic Solids for Photon Energies below the fundamental Band Gap", in E. D. Palik, Handbook of Optical Constants of Solids, (Academic Press, San Diego, 1998), Vol. I, pp. 213-270. [text citation]
[27] M. Schubert, B. Rheinländer, E. Franke, H. Neumann, T. E. Tiwald, J. A. Woollam, J. Hahn, F. Richter, Phys. Rev. B 56, 13306 (1997). [text citation]
[28] D. W. Thompson, M. J. DeVries, T. E. Tiwald, J. A. Woollam, Thin Sol. Films 313, 341 (1998). [text citation]
© 2000 The Materials Research Society