Figure 2

Standard deviation of the c-strain in InGaN layers with various indium fractions. Also shown are the indium fraction fluctuations that correspond to the c-strain fluctuations. The detection limit is the standard deviation of the c-strain in the surrounding GaN matrix.


(click for full image)
top        text     Figure 1     Figure 3        endnotes

last updated Thursday, February 10, 2000 11:34:56 AM.

© 2000 The Materials Research Society MRS Internet Journal of Nitride Semiconductor Research