Base Transit Time in Abrupt GaN/InGaN/GaN and AlGaN/GaN/AlGaN HBTs


Shean-Yih Chiu, A.F.M. Anwar, Shangli Wu
University of Connecticut

This article was presented as part of Symposium G, "Gallium Nitride and Related Alloys" at the 1998 Fall Meeting of the Materials Research Society held in Boston, Massachusetts, November 30-December 4.

Abstract

Base transit time, taub, in abrupt npn GaN/InGaN/GaN and AlGaN/GaN/AlGaN double heterojunction bipolar transistors (DHBTs) is reported. Base transit time strongly depends not only on the quasi-neutral base width, but also on the low field electron mobility, µn, in the neutral base region and the effective electron velocity, Sc , at the edge of base-collector heterojunction. µn and Sc are temperature-dependent parameters. A unity gain cut-off frequency of 10.6 GHz is obtained in AlGaN/GaN/AlGaN DHBTs and 19.1 GHz in GaN/InGaN/GaN DHBTs for a neutral base width of 0.05µm. It is also shown that non-stationary transport is not required to study taubfor neutral base width in the range of 0.05µm for GaN-based HBTs.

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Cite this article as: MRS Internet J. Nitride Semicond. Res. 4S1, G6.7 (1999).


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MRS Internet Journal of Nitride Semiconductor Research
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