Physics-Based Intrinsic Model for AlGaN/GaN HEMTs


Shangli Wu
University of Connecticut

Richard T. Webster
Air Force Research Laboratory

A.F.M. Anwar
University of Connecticut

This article was presented as part of Symposium G, "Gallium Nitride and Related Alloys" at the 1998 Fall Meeting of the Materials Research Society held in Boston, Massachusetts, November 30-December 4.

Abstract

DC and intrinsic small signal parameters are reported for AlGaN/GaN high electron mobility transistors. The calculations are based upon a self-consistent solution of Schrödinger and Poisson's equation to model the quantum well formed in GaN. Transport parameters are obtained from an ensemble Monte Carlo simulation.

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Cite this article as: MRS Internet J. Nitride Semicond. Res. 4S1, G6.58 (1999).


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MRS Internet Journal of Nitride Semiconductor Research
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