High Quality Hydrothermal ZnO Crystals


M. Suscavage, M. Harris, D. Bliss, P. Yip, S-Q. Wang, D. Schwall, L. Bouthillette
Air Force Research Laboratory

J. Bailey, M. Callahan
Solid State Scientific Corporation

D.C. Look
Wright State University

D.C. Reynolds
Wright State Laboratory

R.L. Jones, C.W. Litton
Air Force Research Laboratory

This article was presented as part of Symposium G, "Gallium Nitride and Related Alloys" at the 1998 Fall Meeting of the Materials Research Society held in Boston, Massachusetts, November 30-December 4.

Abstract

Zinc Oxide crystals have historically been grown in hydrothermal autoclaves with a basic mineralizer; however, doubts have been raised about the quality of such crystals because they have often exhibited large x-ray rocking curve widths and low photoluminescence (PL) yield with large linewidths. Several ZnO crystals were grown hydrothermally and sliced parallel to the c-plane. This resulted in opposite surfaces (the C+ and C- ) exhibiting pronounced chemical and mechanical differences. Different surface treatments were investigated and compared by PL both at room temperature and liquid helium temperatures, and by double axis X-ray rocking curve measurements. The high quality of hydrothermally-grown ZnO is substantiated by the narrow rocking curve widths and sharp PL peaks obtained. A critical factor in obtaining these results was found to be surface preparation.

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Cite this article as: MRS Internet J. Nitride Semicond. Res. 4S1, G3.40 (1999).


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MRS Internet Journal of Nitride Semiconductor Research
last updated Saturday, April 3, 1999 2:38:08 AM.
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