Figure 3a

Cross section bright-field TEM micrographs of sample A. The left and right panels correspond to g = 11(-2)0 and g = 0002, respectively. The irregular top and side surfaces are due to the ion milling process.


(click for full image)

Figure 3b

Cross section bright-field TEM micrographs of sample B. The left and right panels correspond to g = 11(-2)0 and g = 0002, respectively. The irregular top and side surfaces are due to the ion milling process.


(click for full image)
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last updated Saturday, April 3, 1999 12:29:06 AM.

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