| Schematic picture of the multiple quantum well sample structure used for this work. |
| The same type of data at 300 K for an InGaN/GaN MQW sample with the InGaN growth temperature at 780 °C. The length scale of intensity fluctuations is now smaller, but still resolved |
| In (c) are shown two PLE spectra for the same sample as in (b), detected at two different photon energies. The PL spectrum obtained with low intensity lamp excitation is also shown. |
| PL transient response at 2 K of the PL peak for the sample in Figure 3 (a). Note the welldefined radiative lifetime of 0.85 ns. |
| In Fig 5 (c) is shown the dependence of the peak position on the excitation intensity for the same sample as in 5 (b). |
| Streak camera panel at 2 K for the same MQW sample as in Figure 5 (a), obtained with fs pulse excitation at about 3.2 eV. Each transient is marked with the corresponding PL emission wavelength (in Å units). Note the short rise time across the whole broad PL spectrum. |
| Timeresolved PL spectra for two MQW samples obtained at 2 K with excitation at 3.6 eV. The time interval between each spectrum is 0.8 ns. In (a) left panel, are shown spectra for the undoped sample D1 in Figure 6, and in (b) right panel, are shown corresponding data for the doped sample D3 in Figure 6. Note the strong spectral shift between the two samples. |
| Decay curves at different photon energies within the broad PL peak, obtained at 2 K with excitation at 3.2 eV for the same MQW samples at in Figure 5 (b). In (a) left panel, is shown the intermediate time regime, on the right panel (b) is shown the long time behavior. |
| Effective decay times for the same two MQW samples as in Figure 5 (a), left panel, and (b), right panel, respectively. The data are shown for 3 different measurement temperatures, 2K, 100 K, and 300 K, and for a number of different wavelengths across the broad PL emission. The excitation wavelength is about 3.2 eV. |