Radiative recombination in In0.15Ga0.85N/GaN multiple quantum well structures
B. Monemar, J. P. Bergman, J. Dalfors, G. Pozina, B.E. Sernelius, P.O. Holtz
Department of Physics and Measurement Technology, Linköping University
H. Amano, I. Akasaki
Department of Electrical and Electronic Engineering, Meijo University
and
High-Tech Research Center, Meijo University
This article was received on Thursday, September 9, 1999 and
accepted on Saturday, December 4, 1999. Abstract
We
present a study of the radiative recombination in
In0.15Ga0.85N/GaN multiple quantum well samples, where
the conditions of growth of the InGaN quantum layers were varied in terms of
growth temperature (< 800 °C) and donor doping. The photoluminescence peak
position varies strongly (over a range as large as 0.3 eV) with delay time
after pulsed excitation, but also with donor doping and with excitation
intensity. The peak position is mainly determined by the Stark effect induced
by the piezoelectric field. In addition potential fluctuations, originating
from segregation effects in the InGaN material, from interface roughness, and
the strain fluctuations related to these phenomena, play an important role, and
largely determine the width of the emission. These potential fluctuations may
be as large as 0.2 eV in the present samples, and appear to be important for
all studied growth temperatures for the InGaN layers. Screening effects from
donor electrons and excited electron-hole pairs are important, and account for
a large part of the spectral shift with donor doping (an upward shift of the
photoluminescence peak up to 0.2 eV is observed for a Si donor density of 2 x
1018 cm-3 in the well), with excitation intensity and
with delay time after pulsed excitation (also shifts up to 0.2 eV). We suggest
a two-dimensional model for electron- and donor screening in this case, which
is in reasonable agreement with the observed data, if rather strong
localization potentials of short range (of the order 100 Å) are present.
The possibility that excitons as well as shallow donors are impact ionized by
electrons in the rather strong lateral potential fluctuations present at this
In composition is discussed.Outline
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Cite this article as: MRS Internet J. Nitride Semicond. Res. 4, 16(1999).
last updated Wednesday, December 8, 2004 2:22:43 PM.© 1999-2004 The Materials Research Society
