Tables

Table I

Spectroscopic Binding Energies
Impurity or State Binding Energy (meV) Reference
a donor (residual in HVPE, MOCVD) 34.4 Present work [12] [13] [14]
b donor* (residual in HVPE) 31.3 Present work [12] [13] [14]
c donor (residual in HVPE, MOCVD) 30.4 Present work [12] [13] [14]
d donor (residual in HVPE, MOCVD) 28.8 Present work [12] [13] [14]
e donor* (residual in HVPE) 27.5 Present work [12] [13] [14]
Si donor (Si-doped material) 22 Present work [12] [13] [14]
Donor (residual in HVPE) 34.5 [28] [29]
Donor in Si-doped sample ~29 [31]
Donors (residual in HVPE) 31.1, 33.8 [30]
Si acceptor (Si-doped material) 224 Present work [12] [14]
Mg acceptor (Mg-doped material) 224 Present work [23]
Free exciton 18-27 Various;
see [10]
Free exciton 26.4 Present work ( [10] [11] [12] [13], [19])
*Existence uncertain

top        main text        figures        endnotes


last updated Tuesday, June 26, 2001 11:58:11 PM.

© 1999-2001 The Materials Research Society MRS Internet Journal of Nitride Semiconductor Research