Figures

Figure 1

XRD (Theta-2Theta) scan of AlN film, grown on Nb sublayer and (0001) Al2O3 substrate.


(click for full image)

Figure 2

Representative X-ray pole figures from: a) (0001) AlN film (pluses) - peaks {10(-1)1}; b) (111) Nb film (filled circles) peaks {200} c) (0001) Al2O3 substrate (triangles) - peaks {0(-1)12}


(click for full image)

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last updated Thursday, November 18, 1999 2:40:28 AM.

© 1999 The Materials Research Society MRS Internet Journal of Nitride Semiconductor Research