Raman study of resonance effects in Ga1-xAlxN solid solutions


F. Demangeot, J. Frandon, M. A. Renucci
Laboratoire de Physique des Solides (ESA 5477 CNRS), Université Paul Sabatier

H. Sands, D. Batchelder
Department of Physics and Astronomy, University of Leeds, United Kingdom

S. Ruffenach-Clur, Olivier Briot, Bernard Gil
Groupe d'Etude des Semiconducteurs, GES-CNRS

This article was received on Monday, June 22, 1998 and accepted on Monday, November 30, 1998.

Abstract

The photoluminescence and Raman spectra of several Ga1-xAlxN layers (0 <= x <= 0.86) grown on sapphire substrates by metal-organic vapor phase epitaxy have been recorded at room temperature, under an excitation at 244 nm. Using the photoluminescence spectra, the variation of the band gap of these alloys can be followed only up to x = 0.5. From resonant Raman scattering, it can be deduced that the band gap energy of the solid solution for x very close to 0.7 corresponds to the incident photon energy (5.08 eV). This result is confirmed by a detailed comparison of the present work with previous experimental data on the A1(LO) phonon peak position, obtained under visible excitation.

Outline

  • Introduction
  • Samples and experiments
  • Experimental results
  • Modeling
  • Summary
  • Acknowledgments
  • Linked Pages

    Cite this article as: MRS Internet J. Nitride Semicond. Res. 3, 52(1998).

    last updated Tuesday, December 1, 1998 4:03:17 PM.

    © 1998 The Materials Research Society MRS Internet Journal of Nitride Semiconductor Research
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