Figure 7

TEM cross-sectional image of sample with 14 % Indium, multi-beam image taken along the [2 (-1) (-1) 0] zone axis. A small pinhole that is not attached to a threading dislocation is visible.


top        text     Figure 6     Figure 8        endnotes

last updated Monday, October 19, 1998 1:11:56 PM.

© 1998 The Materials Research Society MRS Internet Journal of Nitride Semiconductor Research