20) weak-beam image. Misfit dislocations at a pinhole that reaches the heteroepitaxial interface (on the left). The specimen is tilted around the horizontal axis so that the misfit dislocations lines are visible. TEM cross-sectional image of sample with 14 % Indium, (20) weak-beam image. Misfit dislocations at a pinhole that reaches the heteroepitaxial interface (on the left). The specimen is tilted around the horizontal axis so that the misfit dislocations lines are visible.
© 1998 The Materials Research Society
