Schematic of plastic relaxation at deep pinholes that reach the heteroepitaxial interface, as observed in the sample with the highest In content of 14 %. Left: Cross-sectional schematic view of a deep pinhole, parallel to the heteroepitaxial interface (lower horizontal line). Right: Perspective view showing how the misfit dislocations glide away from the deep pinholes.
© 1998 The Materials Research Society
