Figure 3a

RT PL peak wavelength mapping of a full 2" wafer GaInN/GaN heterostructure and wavelength distribution: average wavelength is 382.44 nm with a standard deviation of 0.94 nm (distribution bin size is 1 nm)

(click for full image)

Figure 3b

RT PL peak wavelength mapping of a full 2" wafer AlGaN/GaN heterostructure and wavelength distribution: average wavelength is 340.31 nm with a standard deviation of 0.26 nm (distribution bin size is 1 nm)

(click for full image)

top        text     Figure 2     Figure 4        endnotes

© 1998 The Materials Research Society