This is a discussion of the MIJ-NSR article entitled Optical properties of electron-irradiated GaN by I. A. Buyanova, Mt. Wagner, W. M. Chen, L. Lindström, B. Monemar, H. Amano, I. Akasaki
Description of the paper by the reviewer(s):
Reviewer 1: The authors have use photoluminescence and optically-detected magnetic
resonance techniques to investigate the properties of defect-related
deep levels produced by 2.5 MeV electron irradiation of GaN. Measurements
are performed on both n-type and p-type samples as well as samples on
different substrates. The authors make claims about the nature of the
defects based upon their analysis.
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