Temperature behaviour of the yellow emission in GaN


R. Seitz, C. Gaspar, T. Monteiro, E. Pereira
Departamento de Física, Universidade de Aveiro

M. Leroux, B. Beaumont, Pierre Gibart
Centre de Recherche sur l'Hetero-Epitaxie et ses Applications, CRHEA-CNRS

This article was received on July 16, 1997 and accepted on September 15, 1997.

Abstract

Even in good quality undoped GaN samples, as assessed by the intense excitonic emission, the yellow band is present. This band has been attributed either to a shallow donor to deep double donor pair recombination [1], to a deep donor to a shallow acceptor [2] or to a shallow donor and a deep state [3]. However, its origin is not yet clear. We present data on time resolved spectroscopy compared with steady state results. These results indicate that there is no difference in band shape between steady state and time resolved spectra at all temperatures. However, in some samples there is an increase in intensity of the yellow band. It is concluded that besides a fast emission, due to prompt excitation of the centre, an indirect path from a trap 13.7 meV below the shallow donor is responsible for the long component of the decay and the intensity increase. An emission with a lifetime of ca. 300 ms is also present with a maximum at 2.35 eV.

Outline

  • Introduction
  • Materials and Methods
  • Experimental Results and Discussion
  • Conclusions
  • Acknowledgments
  • Linked Pages

    Cite this article as: MRS Internet J. Nitride Semicond. Res. 2, 36(1997).

    last updated October 17, 1997 4:58:03 PM.

    © 1997 The Materials Research Society MRS Internet Journal of Nitride Semiconductor Research
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