Photoluminescence excitation spectroscopy of GaN thin layers as a function of temperature


C. Guénaud, E. Deleporte, M. Voos, C. Delalande
Laboratoire de Physique de la Matière Condensée, École Normale Superièure, Paris, France

B. Beaumont, M. Leroux, Pierre Gibart , J. P. Faurie
Centre de Recherche sur l'Hetero-Epitaxie et ses Applications, CRHEA-CNRS

This article was received on June 10, 1997 and accepted on July 9, 1997.

Abstract

We report on photoluminescence and photoluminescence excitation experiments performed on hexagonal GaN layers grown on a Sapphire substrate. Information about extrinsic and intrinsic optical properties have been obtained. We show that, at low temperature, the fundamental A excitons are preferentially involved in the relaxation towards the neutral donor bound exciton photoluminescence line, while electron-hole pairs rather participate in the relaxation towards D0-A0 emission and the yellow band. The relaxation from the A exciton towards the yellow band and D0-A0 emission is made easier by temperature. The band structure of the GaN layers has been determined from temperature dependent photoluminescence excitation spectroscopy: A and C excitons and A continuum band gap have been identified up to 210K.

Outline

  • Introduction
  • Experimental results.
  • Experimental set-up
  • Low temperature luminescence and luminescence excitation spectra.
  • Luminescence and luminescence excitation spectra versus temperature.
  • Conclusion
  • Acknowledgments
  • Linked Pages

    Cite this article as: MRS Internet J. Nitride Semicond. Res. 2, 10(1997).

    last updated October 14, 1997 5:35:28 PM.

    © 1997 The Materials Research Society MRS Internet Journal of Nitride Semiconductor Research
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