Study of GaN films grown by metalorganic chemical vapour deposition


W. Van der Stricht, I. Moerman, P. Demeester
University of Ghent-IMEC, Department of Information Technology

J. A. Crawley, E. J. Thrush
Thomas Swan & Co., Ltd.

This article was received on May 31, 1996 and accepted on August 5, 1996.

Abstract

In this paper GaN films are examined, which are grown on basal plane (0001) sapphire substrates. Growth is performed in a novel type of vertical rotating disk reactor. The effects of several growth parameters on the film quality are discussed. The results on n-type doping of GaN with SiH4 are presented. The GaN layers were evaluated by surface morphology studies, DC X-ray diffraction, electrical and optical characterisation.

Outline

  • Introduction
  • Experiment
  • The MOCVD-reactor
  • Growth procedure
  • Characterisation
  • Results
  • GaN growth and characterisation
  • N-type doped GaN
  • Conclusion
  • Acknowledgments
  • Linked Pages

    Cite this article as: MRS Internet J. Nitride Semicond. Res. 1, 3(1996).

    last updated January 6, 1998 2:33:13 PM.

    © 1996-1998 The Materials Research Society MRS Internet Journal of Nitride Semiconductor Research
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